Description
Category: Technology Licenses
Created On: 2022-04-28
Record Count: 4
Primary Industries
- Semiconductors
- Fabrication
- Material Composite
- Telecommunications Equip
- Mobile
- Test/Monitoring
- Energy Resources & Svcs
- Alternative and Renewable Energy
- Solar
- Device
- Laser
- Optical
IPSCIO Report Record List
Below you will find the records curated into this collection. This summary includes the complete licensed property description so that you can review and determine if this collection covers the topics, technology or transaction type that is relevant for your needs. The full report will include all relevant deal data such as the royalty base, agreement date, term description, royalty rates and other deal terms. For reference, here is a sample of a full IPSCIO curated royalty rate report: Sample Report
IPSCIO Record ID: 27484
“Single-Crystal BAW Filter Products or Technology†shall mean acoustic wave piezoelectric raw materials, wafers, resonators or BAW filters where a piezoelectric material is characterized by X-ray diffraction with clear peak at a detector angle (2-?) associated with single crystal film and whose Full Width Half Maximum (FWHM) is measured to be less than 1.0°, or where a piezoelectric material is produced using any and all techniques, excluding a thin film piezoelectric material deposited directly on the resonator metal electrode without use of any single crystal seed layer or wafer material.
Single-crystal bulk acoustic wave (BAW) filters for the mobile-wireless industry, facilitates signal acquisition and accelerates band performance between the antenna and the back end of mobile devices.
IPSCIO Record ID: 286021
(a) U.S. Patent 4,710,030, Optical generator and detector of stress pulses.
(b) U.S. Patent 5,706,094, Ultrafast optical technique for the characterization of altered materials
(c) U.S. Patent 5,864,393, Optical method for the determination of stress in thin films.
(d) U.S. Patent 5,748,317, Apparatus and method for characterizing thin film and interfaces using an optical heat generator and detector.
(e) U.S. Patent 5,748,318, Optical stress generator and detector.
(f) U. S. Patent 5,844,684, Optical method for determining the mechanical properties of a material.
Licensed Product shall not, however, include (i) replacement parts provided or sold to end-users after the initial system is delivered; (ii) all software provided after delivery which does not provide additional functional capabilities which incorporates the claims of the Patent Rights; (iii) software upgrades or revisions which do not provide additional functional capabilities which incorporates the claims of the Patent Rights; (iv) service and maintenance of hardware and/or software and peripherals to the system. For purposes of this Agreement, a product shall be deemed a Licensed Product if such product is covered, in whole or in part, by at least one Patent Right in one country, whether or not that product is made, used or sold within that country. For example, an instrument system that incorporates one of the claims of U.S. Patent 4,710,030 would be a Licensed Product and would be subject to a royalty payment if sold in Japan, even though there is no issued patent in Japan.
Metal and Opaque Thin Film Measurement Solutions. Licensee's MetaPULSE family of metrology systems incorporates our proprietary technology for optical acoustic metrology, which allows customers to simultaneously measure the thickness and other properties of up to six metal or other opaque film layers in a non- contact manner on product wafers. By minimizing the need for test wafers, MetaPULSE enables Licensee's customers to achieve significant cost savings. Licensee believe that Licensee currently offer the only systems that can non-destructively measure up to six metal film layers with the degree of accuracy semiconductor device manufacturers demand. Licensee's MetaPULSE systems use ultra-fast lasers to generate sound waves that pass down through a stack of metal or opaque films such as copper and aluminum, sending back to the surface an echo which is detected and analyzed. These systems precisely measure the films with Angstrom accuracy and sub-Angstrom repeatability at high throughputs. This accuracy and repeatability is critical to semiconductor device manufacturers' ability to achieve higher manufacturing yields with the latest fabrication processes.
IPSCIO Record ID: 27673
Subject to exceptions in this Agreement, Licensee shall pay royalties to Licensor for the use of MNIP. The royalty shall be based on two main elements the success of the relevant MNIP in achieving Cost Savings and the success of that MNIP in achieving Added Value. MNIP means Material New IP.
Licensed Products means Wafers, Cells, and/or Modules, as the case may be, in which the Wafers are made using String Ribbon Technology.
Licensed Products means Wafers, Cells, and/or Modules, as the case may be, in which the Wafers are made using String Ribbon Technology. This is to be used in the manufacture of Licensee's solar modules. The Licensor develops and manufactures multi-crystalline silicon wafers utilizing String Ribbonâ„¢ proprietary wafer technology. The technology involves a unique process to produce multi-crystalline silicon wafers by growing thin strips of silicon that are then cut into wafers. This process substantially reduces the amount of silicon and other processing costs required to produce a wafer when compared to conventional sawing processes. Silicon is the key raw material in manufacturing multi-crystalline silicon wafers. The wafers they produce are the primary components of photovoltaic (“PVâ€) cells which, in turn, are used to produce solar panels (also referred to as solar modules).
IPSCIO Record ID: 166414
'Full Wafer Technology' shall mean a batch processing chlorine- assisted ion beam etching technique capable of producing more than one edge emitting semiconductor ridge waveguide laser having a gallium arsenide quantum well active region.
